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翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク Non-contact atomic force microscopy ： ウィキペディア英語版 Non-contact atomic force microscopy Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During in measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance (amplitude modulation) or by measuring the change in resonant frequency directly using a feedback circuit (usually a phase-locked loop) to always drive the sensor on resonance (frequency modulation). ==Modes of operation== The two most common modes of nc-AFM operation, frequency modulation and amplitude modulation, are described below. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Non-contact atomic force microscopy」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.